Understanding complex materials using advanced electron microscopy

Electron microscopy has seen tremendous developments over the last couple years providing unprecedented possibilities in materials characterization at the nanometer and atomic scale. With the high spatial resolution and high beam currents available in aberration corrected (S)TEM, highly sensitive detectors for imaging and spectroscopy and fast readout speeds, new microscopy methods have been established, which enable advanced insights into materials, their 2D/3D structure and chemistry as well as some of their functional properties. With this presentation, I want to provide an overview of the techniques and illustrate the information that can be obtained by transmission electron microscopy. Examples will include atomic resolution imaging and spectroscopy and different 4D-STEM approaches to understand structure and properties (electric, magnetic or mechanical) of oxide-based quantum materials, advanced aluminium alloys and metallic glasses.